Learn Strategies for Reducing Cost of Test at the 2008 Automated Test Summit Leading test and measurement companies worldwide are taking part in this virtual industry event, hosted by National Instruments, to share their tips and best practices for reducing cost of test. By participating in this online event, you can experience the presentations, exhibitors, and dynamic atmosphere of a traditional conference — all from the convenience of your desk. Access session overviews and register for this free event.
FEATURES
Engineering Feature · By Roger Allan, Technical Editor
More powerful cameras and greater video-analysis capabilities push intelligent video beyond traditional industrial uses to surveillance, consumer, automotive, and other applications.
Technology Report · By Roger Allan, Technical Editor
Integrated silicon photodetectors and other compound semiconductors serve a range of applications while yielding record-performance results that make for a bright future.
Engineering Essentials · By Bill Wong, Embedded/Systems/Software Editor
Standard board form factors typically support parallel and serial interfaces. But as their availability grows, they're gently nudging out the older standards.
DEPARTMENTS
Lab Bench · By Bill Wong, Embedded/Systems/Software Editor
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