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[Design Application]

Packaging Takes Center Stage In IC Design Process


Conquering the challenges of high-frequency designs demands a skilled package architect with an eye for electrical requirements.

Contributing Author  |   ED Online ID #7618  |   June 8, 1998

Article Rating: Not Rated

Not many years ago, the only packaging issue that routinely concerned

most chip designers was pin count. Package problems belonged to manufacturing,

and designers were happy to "toss the project over the wall" once the

prototypes had been tested successfully. Today, though, packaging is no

longer an afterthought in chip design.

In the last few years, performance demands have changed rapidly, bringing

lower voltages, increases in current, higher frequencies, and faster rise

times to high-end digital and mixed-signal ICs (Fig. 1).

Just as these factors modify the operation of the chip circuitry, they

also alter the electrical requirements of the package. Designers who ignore

these side effects in the package risk product failure.

In addition, rising package costs reflect the growing difficulty of

keeping the package environment from interfering with chip operation.

Multiple power and ground planes, and special routing and vias combine

to raise the cost of the package as high as, or even higher, than the

silicon it contains. Used appropriately, these features enhance the operation

of the device, but they also serve to complicate the overall design picture.

Fortunately, package modeling tools have come a long way in recent years,

providing designers with ways to evaluate the behavior of a chip within

its package. Electrical models complement thermal and stress models to

provide a complete picture of how the package will behave in operation.

Together with models of the silicon circuitry, electrical package models

can be fed into simulation tools such as Spice. Based on the results of

simulation, a designer can change the chip layout or packaging features

to ensure that the design works properly. Before going to the appropriate

packaging house or vendor, however, a number of steps can be taken to

facilitate the vendor-designer interface, to ensure a successful design.

The Package Environment
Although package modeling tools perform complex calculations, they cannot

yet make critical design decisions. Therefore, the chip designer must

understand how package characteristics can adversely affect a design.

The designer can then tailor the chip for the package and make appropriate

trade-offs to correct package problems that show up in simulation.

In a general way, a package behaves as a low-pass filter, because the

RLC structure attenuates the voltage for fast changes in current (Fig.

2). So, at the very least, modeling tools must be able to predict

the effects of resistance, inductance, and capacitance in the leads during

worst-case chip operation. It is important to keep in mind that conductors

within a package are not resistors, capacitors, and inductors in the sense

of point features, but instead have distributed RLC properties along the

length of the leads. Additional factors that may need modeling, depending

on requirements, include lead impedance, signal timing, and the effects

of energy dissipation throughout the package at high frequencies.

One of the axioms of package modeling is that a parametric value for

a single lead indicates very little by itself. Any meaningful analysis

must include coupling to all significant current paths, as well as any

nearby signals that are potential sources of interference. Moreover, the

model must be used in conjunction with simulation tools to provide a realistic

picture of the package environment.

Package modeling considerations hold true for both mixed-signal and

digital designs. Mixed-signal applications tend to use simpler packages

with lower pin counts. They operate efficiently at high frequencies due

to very short, low-inductance leads, and an abundant distribution of ground

pins. Digital devices have generally required higher pin counts, increasing

the complexity of the package, and, in some cases, requiring multiple-layered

packages with ground (GND) and power (PWR) planes. As a result, each type

of design receives a different emphasis during package modeling, though

the overall concerns are the same.

In many designs, the overriding package problem is inductance, which

is responsible for much of the voltage drop across leads. A significantly

damaging effect of high inductance is ground bounce, in which the ground

voltage level rises during rapid changes of current levels as the device

operates. Power droop, in which the supply voltage (VSS) level

falls, can occur as well. In both cases, inaccurate reference voltages

can interfere with switching thresholds and cause bit errors, or restrict

the operational range of signals.

The inductance of a lead considered in isolation (LSELF)

depends largely on the section geometry and the length of the lead, though

the latter relation is not linear. LSELF values must be combined

with mutual inductance (LMUT) values among the signal paths

to obtain the effective inductance (LEFF) when predicting the

behavior of the package. LEFF reflects how the magnetic fields

within the package behave as signals propagate through the circuit. Factored

with the current change rate (di/dt), LEFF yields a voltage

drop. Faster circuits, therefore, yield more voltage stability problems

if LEFF remains the same.

Obviously, the challenge is to keep LEFF as low as possible,

because rise times are likely to become faster and current levels higher

in future designs. Physical isolation of conductors has a large effect

on LMUT values, and thus on LEFF. All other things

being equal, a pair of leads that are adjacent have higher LMUT

values than a pair that are isolated.

To predict inductance effects accurately, the modeling software not

only has to determine dynamic LEFF values for the leads, it

also has to analyze how PWR and GND planes affect inductance in different

areas. PWR and GND planes may serve to minimize overall LEFF

in the package, especially in areas where they couple the current return

paths to the signal lines. The software must be able to evaluate how local

LEFF values are modified by the routing of signals, the placement

of exit points for current sources and sinks, and irregularities such

as holes in the plane for special structures.




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